Publications

Probabilistic Model Checking for IEC 61499: A Manufacturing Application

Published in 2024 IEEE International Conference on Industrial Technology (ICIT), 2024

Recommended citation: I. Faqrizal, T. Liakh, M. Xavier, G. Salán, V. Vyatkin. "Probabilistic Model Checking for IEC 61499: A Manufacturing Application." 2024 IEEE International Conference on Industrial Technology (ICIT), 2024.

Generating Portable Test Cases for IEC 61499 FBs from Interface Behaviour Specifications

Published in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA), Sinaia, Romania, 2023

Recommended citation: B. Wiesmayr, M. Xavier, S. Patil, A. Zoitl, V. Vyatkin. "Generating Portable Test Cases for IEC 61499 FBs from Interface Behaviour Specifications." 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA), Sinaia, Romania, 2023.

DeLMS: A Decentralized Learning Management System using Ethereum Smart Contracts and IPFS

Published in 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), Lemgo, Germany, 2023

Recommended citation: M. Xavier, P. Sobha, S. Patil, V. Vyatkin. "DeLMS: A Decentralized Learning Management System using Ethereum Smart Contracts and IPFS." 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), Lemgo, Germany, 2023.

Formal modelling, analysis, and synthesis of modular industrial systems inspired by Net Condition/Event Systems

Published in 44th International Conference on Application and Theory of Petri Nets and Concurrency (PETRI NETS 2023), Lisbon, Portugal, 2023

Recommended citation: M. Xavier, S. Patil, V. Dubinin, V. Vyatkin. "Formal modelling, analysis, and synthesis of modular industrial systems inspired by Net Condition/Event Systems." 44th International Conference on Application and Theory of Petri Nets and Concurrency (PETRI NETS 2023), Lisbon, Portugal, 2023.

Developing a Test Suite for Evaluating IEC 61499 Application Portability

Published in 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE), Helsinki, Finland, 2023

Recommended citation: M. Xavier, T. Liakh, S. Patil, V. Vyatkin. "Developing a Test Suite for Evaluating IEC 61499 Application Portability." 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE), Helsinki, Finland, 2023.

Formal verification of observers supervising a cyber-physical system implemented using IEC 61499

Published in 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE), Helsinki, Finland, 2023

Recommended citation: P. Ovsiannikova, E. Le Priol, V. Perret, P. Jhunjhunwala, M. Xavier, V. Vyatkin. "Formal verification of observers supervising a cyber-physical system implemented using IEC 61499." 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE), Helsinki, Finland, 2023.

Process mining in industrial control systems

Published in 2022 IEEE 20th International Conference on Industrial Informatics (INDIN), 2022

Recommended citation: M. Xavier, V. Dubinin, S. Patil, V. Vyatkin. "Process mining in industrial control systems." 2022 IEEE 20th International Conference on Industrial Informatics (INDIN), 2022.

Plant model generator from digital twin for purpose of formal verification

Published in 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2021

Recommended citation: M. Xavier, J. Håkansson, S. Patil, V. Vyatkin. "Plant model generator from digital twin for purpose of formal verification." 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2021.